Spectral Decomposition and Attributes for Evaluating Seismically Thin Layers

dc.contributor.advisorCastagna, John P.
dc.contributor.committeeMemberChesnokov, Evgeni M.
dc.contributor.committeeMemberStewart, Robert R.
dc.contributor.committeeMemberMartinez, Alex
dc.creatorZhou, Jian 1982-
dc.date.accessioned2019-09-14T16:44:16Z
dc.date.available2019-09-14T16:44:16Z
dc.date.createdMay 2017
dc.date.issued2017-05
dc.date.submittedMay 2017
dc.date.updated2019-09-14T16:44:17Z
dc.description.abstractThe reflectivity series and resulting waveform for a generalized-simple layer (arbitrary reflection coefficients on top and base) can be separated into unique even and odd components, each having a different tuning curve. Amplitudes at peak frequency of pure-impulse pairs are independent of thickness, for either the original reflectivity, its odd, or even component. For seismic data with a non-flat spectrum, dividing the data spectrum over some useable band by the wavelet spectrum results in amplitudes at peak frequency that are independent of thickness. Comparing peak-frequency amplitudes for even and odd components to that of the total waveform, provides clues as to the nature of the layering. Correlations between spectral-isofrequency-amplitude traces (time-varying-spectral amplitude at individual frequencies) provide a means of finding frequency notches induced by layer reflectivity. Isofrequency-amplitude traces tend to be strongly correlated amongst frequencies at spectral nulls; and amongst those that are not at those frequency notches. Spectral-principal-component-amplitude attributes take advantage of this property, and are indicative of layer thickness. With proper trace scaling and spectral balancing, spectral-PC amplitudes are independent of layer’s reflection coefficients. Layers with only odd and even pair reflection coefficients have distinctive-spectral-principal component to thickness relationships in synthetic-wedge models. Three spectral-PC attributes individually delineate amplitudes from: 1) an isolated reflection not affected by tuning; 2) tuning of an even reflection pair; and 3) tuning of an odd reflection pair in a 3-D-synthetic-channel model. As with the synthetic model, a good attribute versus true-reservoir-thickness relationship is seen in real seismic and well data from the Hoover field in the Gulf of Mexico.
dc.description.departmentEarth and Atmospheric Sciences, Department of
dc.format.digitalOriginborn digital
dc.format.mimetypeapplication/pdf
dc.identifier.citationPortions of this document appear in: Zhou*, Jian, Arnold Oyem, and John P. Castagna. "An algorithm for frequency-dependent principal component spectral analysis." In SEG Technical Program Expanded Abstracts 2014, pp. 2636-2640. Society of Exploration Geophysicists, 2014.
dc.identifier.urihttps://hdl.handle.net/10657/4598
dc.language.isoeng
dc.rightsThe author of this work is the copyright owner. UH Libraries and the Texas Digital Library have their permission to store and provide access to this work. UH Libraries has secured permission to reproduce any and all previously published materials contained in the work. Further transmission, reproduction, or presentation of this work is prohibited except with permission of the author(s).
dc.subjectSpectral decomposition
dc.subjectGeneralized simple layer
dc.subjectSeismic thickness delineation
dc.titleSpectral Decomposition and Attributes for Evaluating Seismically Thin Layers
dc.type.dcmiText
dc.type.genreThesis
thesis.degree.collegeCollege of Natural Sciences and Mathematics
thesis.degree.departmentEarth and Atmospheric Sciences, Department of
thesis.degree.disciplineGeophysics
thesis.degree.grantorUniversity of Houston
thesis.degree.levelDoctoral
thesis.degree.nameDoctor of Philosophy

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