Scanning Raman Spectroscopy for Reel-to-Reel Characterization of Second-Generation High Temperature Superconductors

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dc.contributor.advisorRobles Hernandez, Francisco C.
dc.contributor.committeeMemberMajkic, Goran
dc.contributor.committeeMemberBrankovic, Stanko R.
dc.contributor.committeeMemberSelvamanickam, Venkat
dc.contributor.committeeMemberBenhaddou, Driss
dc.creatorCastaneda Quintero, Nathaly Andrea
dc.creator.orcid0000-0001-8663-970X
dc.date.accessioned2022-08-08T22:09:21Z
dc.date.available2022-08-08T22:09:21Z
dc.date.createdAugust 2021
dc.date.issued2021-08
dc.date.updated2022-08-08T22:09:22Z
dc.description.abstractWe have implemented fast Raman spectroscopy as a characterization method to predict, evaluate and characterize a variety of features of interest for Second Generation High-Temperature Superconductors (2G-HTS), including defect and composition characterization, as well as correlation with critical current density (Jc) over a wide extent of magnetic fields (0-14T) and temperatures (4.2-77K). A major factor for the successful implementation of this technique is the optimization of the scanning parameters that includes a large number of variables to reach the best spatial and spectral resolution needed to obtain detailed sample information. We first demonstrate the capability of implementation of scanning Raman to scan pristine and defective areas about 80 mm2 on short samples utilizing a motorized XY motion stage. These scanning Raman results have been complemented with linear scans by two-dimensional x-ray diffraction (2D-XRD) in order to validate and cross-compare the results and the sensitivity of the technique. Next, the effectiveness of polarized Raman for evaluating the biaxial texture has been investigated in this work. Additionally, Raman features have been correlated not only to superconducting properties of the tapes acquired by vibrating-sample magnetization (VSM) but also with composition non-stoichiometry and nanorod dopant level of REBCO (rear earth = Gd, Y) thin films obtained by wavelength-dispersive x-ray spectroscopy (WDS) and induced coupled plasma (ICP) methods. Finally, the findings from these studies have been used to design a reel-to-reel system for in-line quality control of long-length coated conductors.
dc.description.departmentEngineering Technology, Department of
dc.format.digitalOriginborn digital
dc.format.mimetypeapplication/pdf
dc.identifier.citationPortions of this document appear in: Castaneda, Nathaly, Goran Majkic, and Francisco C. Robles. "Scanning Raman spectroscopy for inline characterization of 2G-HTS conductors." Superconductor Science and Technology 34, no. 3 (2021): 035032.
dc.identifier.urihttps://hdl.handle.net/10657/10726
dc.language.isoeng
dc.rightsThe author of this work is the copyright owner. UH Libraries and the Texas Digital Library have their permission to store and provide access to this work. UH Libraries has secured permission to reproduce any and all previously published materials contained in the work. Further transmission, reproduction, or presentation of this work is prohibited except with permission of the author(s).
dc.subjectSuperconductors
dc.subjectYBCO
dc.subjectRaman Spectroscopy
dc.subject2D-XRD
dc.titleScanning Raman Spectroscopy for Reel-to-Reel Characterization of Second-Generation High Temperature Superconductors
dc.type.dcmiText
dc.type.genreThesis
thesis.degree.collegeCullen College of Engineering
thesis.degree.departmentEngineering Technology, Department of
thesis.degree.disciplineEngineering Technology
thesis.degree.grantorUniversity of Houston
thesis.degree.levelMasters
thesis.degree.nameMaster of Science

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