Brankovic, Stanko R.2014-12-192014-12-19December 22012-12http://hdl.handle.net/10657/833Image processing can be used to extract cluster parameters from STM image. The objective observation from the obtained data can be used to understand certain processes in Material Science. One such application is to study under-potential deposition where the substrate surface is modified with a sub-monolayer of different noble metal. This thesis aims to develop a user friendly GUI (Graphical User Interface) that helps researchers to draw an inference by quantifying parameters like layer coverage, nucleation density, cluster area, and perimeter by area from an STM image. It uses an algorithm that filters noise using a custom made filter mask and then applies the OTSU segmentation technique to fit Gaussian curve on the image histogram for detecting the presence of a layer(s) of cluster in the STM image. It creates a binary image for each layer detected in the image. Cluster parameters are obtained by processing this binary image.application/pdfengThe author of this work is the copyright owner. UH Libraries and the Texas Digital Library have their permission to store and provide access to this work. Further transmission, reproduction, or presentation of this work is prohibited except with permission of the author(s).MicrofabricationSTMImage processingMatlab GUISoftware engineeringMaterial ScienceNanofabricationSTM Image AnalysisAlgorithm DevelopmentImage SegmentationOTSUGaussianElectrical engineering2014-12-19Thesisborn digital