Synthesis and analysis of a precise programmable MOS tester and four-phase clock pulse

A tester for complex MOS integrated circuits has been developed which includes several novel features which have not heretofore been available in such test devices. This tester has provision for performing dynamic logic function tests and complete parametric tests on devices having as many as 60 leads. All bias and signal voltages are programmable with high precision and under control of a digital computer. A four-phase, programmable clock is included. [...]