I. Thermal electron attachment to halogen molecules and halogenated methanes. II. Neon resonance line, nickle-63 and scandium tritide as sources for ECD



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The pulse sampling technique with a Ni electron capture detector (ECD) has been utilized to investigate thermal electron attachment (TEA) to halogens (Cl[lowered 2], Br[lowered 2] and I[lowered 2]) and halogenated methanes (CCl[lowered 4], CHCl[lowered 3], CH[lowered 2]Cl[lowered 2] and CH[lowered 3]Br). Thermal electron attachment rate constants have been obtained at T = 26°C. Values for in units of cc[dot]molecule[raised -1][dot]sec[raised -1] have been obtained as follows: CCl[lowered 4] : (7.3[plus-minus]0.8) x 10[raised -8]; CHCl[lowered 3] : (1.6[plus-minus]0.2) x 10[raised -9]; CH[lowered 2]Cl[lowered 2] : (2.1[plus-minus]0.2) x 10[raised -13]; CH[lowered 3]Br : (3.9[plus-minus]0.3) x 10[raised -12]. The results for CHCl[lowered 3] and CH[lowered 3]Br agree very well with results in the literature. The rate constants for CCl[lowered 4] are two to four times lower than the results in the literature. For CH[lowered 2]Cl[lowered 2] the rate constant is at least one order of magnitude lower than other results...